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0 索取号:TN304.23-53/E701/1966 作者: 出版社:London : Institute of Physics & the Physical Society, 1967].
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0 索取号:TN304.07-53/E801/1973 作者:Symposium on Semiconductor Memory Testing (1973 : Cherry Hill)、IEEE Computer Society Mideastern Area Committee.、The Philadelphia Chapter of the Institute of Electrical and Electronics Engineers、 Inc.、 出版社:New York : IEEE, c1973.
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0 索取号:TN27-53/E801 作者:Symposium on Current Mathematical Problems in Image Science (1976 : Monterey、 Calif.)、Wilde、 Carroll O.、Barrett、 Eamon.、 出版社:North Hollywood, Calif. : Western Periodicals Co., 1977.
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0 索取号:TN249-53/E805/1975 作者:LDA-Symposium、 Technical University of Denmark、 1975.、Buchhave、 Preben.、Copenhagen. Polyteknisk l´reanstalt.、 出版社:Skovlunde : Proceedings LDA-Symposium Copenhagen 1975, 1976.
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0 索取号:TN153-53/E803/1977 作者: 出版社:Bristol : Institute of Physics, 1977.
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0 索取号:TN153-53/E804/1972 作者:Illinois Institute of Technology. Research Institute.、Johari、 Om.、Corvin、 Irene.、 出版社:Chicago, Ill. : IITRI, 1972.
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0 索取号:TN146.8-53/E801/7 作者:National Conference on Electron Probe Analysis (7th : 1972 : San Francisco)、Electron Probe Analysis Society of America.、 出版社:Pittsburgh : L. Vassamillet, Carnegie-Mellon University, [1972?]
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0 索取号:TN146.8-53/E801/6 作者:National Conference on Electron Probe Analysis (6th : 1971 : Pittsburgh、 Pennsylvania)、Electron Probe Analysis Society of America.、 出版社:Pittsburgh, Pennsylvania : Pittsburgh Hilton Hotel, 1971.
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0 索取号:TN141-53/E801/1974 作者:Conference on Display Devices and Systems (1974 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、Society for Information Display.、United States. Advisory Group on Electron Devices.、 出版社:[New York, N.Y. : Institute of Electrical and Electronics Engineers], c1975.
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0 索取号:TN14-53/E801/11 作者:Symposium on Electron、 Ion、 and Laser Beam Technology (11th : 1971 : University of Colorado)、Thornley、 R. F. M. (Richard Frank Maute)、 1933-、IEEE Group on Electron Devices.、American Vacuum Society.、University of Colorado (Boulder campus)、 出版社:San Francisco, Calif. : San Francisco Press, c1971.
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0 索取号:TN14-53/E801/10 作者:IEEE Symposium on Electron、 Ion、 and Laser Beam Technology (10th : 1969 : Gaithersburg、 Md.)、Marton、 L. (Ladislaus)、 1901-、Institute of Electrical and Electronics Engineers.、American Vacuum Society.、University of Maryland、 College Park.、United States. National Bureau of Standards.、 出版社:San Francisco : San Francisco Press, [c1969].
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0 索取号:TN102-53/E801/11 作者:Conference on Electron Device Techniques (11th : 1973 : New York、 N.Y.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、 出版社:New York, N.Y. : IEEE, c1973.
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0 索取号:TN1-53/E906 作者:International Symposium on Discharges and Electrical Insulation in Vacuum. (11th : 1984 : Berlin、 Germany)、Akademie der Wissenschaften der DDR. Zentralinstitut für Elektronenphysik、Physikalische Gesellschaft der DDR、Institut "Prüffeld für elektrische Hochleistungstechnik."、Kombinat VEB Elektro-Apparate-Werke Berlin-Treptow、Institute of Electrical and Electronics Engineers、 出版社:Berlin : Academy of Sciences of the GDR, Central Institute of Electron Physics (ZIE) ; New York : [Distributed by] Institute of Electrical and Electronics Engineers, c1984
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0 索取号:TN06-53/E802/1970 作者:Symposium on Reliability (1970 : Los Angeles、 Calif.)、Institute of Electrical and Electronics Engineers.、 出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers, c1970.
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0 索取号:TN06-53/E801/11 作者:International Reliability Physics Symposium. (11th : 1973 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1973.
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0 索取号:TN06-53/E801/10 作者:International Reliability Physics Symposium. (10th : 1972 : Las Vegas、 Nev.)、Institute of Electrical and Electronics Engineers. Electron Devices Group.、IEEE Reliability Group.、 出版社:New York : Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineers, c1972.
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